The Japanese Society of Microscopy Award for Y. Sato 2009

Congraturation for Dr. Yohei Sato-san!

Dr. Yohei Sato is an assistant professor at Electron microscopy and spectroscopy group (Terauchi Lab.), Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

On May 28th, 2009, The Japanese Society of Mictroscopy gave us "The Japanese Society of Microscopy Award for the Scientific Paper (MATERIALS) in 2009" for the paper entitled "High energy-resolution electron energy-loss spectroscopy study of the electric structures of double-wall carbon nanotubes" by Yohei Sato, Masammi Terauchi, Yahachi Saito and Riichiro Saito, published in Journal of Electron Microscopy, 55, 132-142 (2006).

A high resolusion electron energy-loss spectroscopy (EELS) enable us the van-Hove singularity energy positions of constituent nanotube of an isolated double wall carbon nanotubes. Combined with the calculation, we can assign (n,m) values of each nanotubes by EELS.

Last modified: Thu Jun 4 18:23:07 JST 2009