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{\Large \bf Surface / Interface Science Group}\\
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Professor           &:&Toshio~Sakurai\\
Associate Professor &:&Tadaaki~Nagao\\
Assistant Professor &:&Yasunori~Fujikawa,~Jerzy T. Sadowski, \\
&& and Yukiko~Yamada-Takamura\\
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(http://apfim.imr.tohoku.ac.jp/)\\
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    In Surface / Interface Science group at Institute for Materials
Research, we have been studying atomic properties on solid surfaces and
interfaces. Our works using our own developed scanning tunneling
microscope (FI-STM), high-momentum-resolution electron energy loss 
spectrometer (ELS-LEED), ballistic electron emission microscope 
(BEEM), atom-probe field ion microscope (AP-FIM), are highly recognized 
internationally, and we are cited as one of the ten best scientific groups
in the world (Science Watch, Oct. issue, 1995). Our research subjects
include semiconductors (elemental and compound), metals (elemental,
alloy and amorphous), and organic materials (fullerene and pentacene 
molecules). Some of the topics of our recent research  are following: 
(1) atomic structure and electronic properties on surfaces of MBE grown 
GaAs, InAs  and  GaN, by using variable-temperature STM/AFM (2) nanoscale 
characterization and electronic excitations of ultrathin films by spot 
profile analysing low-energy electron diffraction (SPA-LEED) and ELS-LEED 
(3) Ge growth on vicinal and high-index Si surface by STM (4) 
development of low temperature BEEM and a study of electron transport 
through nano-scale domains of interfaces on Si surfaces (5) formation 
mechanisms of nano-crystalline materials (6) High resolution 
electron energy loss spectroscopy (HREELS) for the structural and the 
chemical measurements on surfaces.

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